2 problems

Let $m$ be the number of Fourier measurements with coded diffraction patterns, let ${\bm w}\in{\mathbb R}^m$ be an additive measurement-noise vector, and let $\|{\bm w}\|_2$ denote…

Let $n$ be the signal dimension and let $\frac{1}{\epsilon^2}$ denote the accuracy-dependent sample-complexity scale for one-bit phase retrieval. Consider alternating minimization…