The general-dimensional identifiability characterization of global rigidity

Let pp be an even positive integer with p2p\neq 2, let dd be a positive integer, and let GG be a connected graph with n3n\geq 3 vertices. Let πG(CMnp)\overline{\pi_G(\mathcal{CM}^p_n)} denote the relevant projected pp-Cayley–Menger variety, and let dd-identifiability and dd-tangential weak defectivity have their usual meanings.

General-dimensional characterization conjecture. The following conditions are equivalent:

  1. A/every generic dd-dimensional framework (G,p)(G,\bm p) is globally rigid in pd\ell_p^d.
  2. πG(CMnp)\overline{\pi_G(\mathcal{CM}^p_n)} is dd-identifiable.
  3. πG(CMnp)\overline{\pi_G(\mathcal{CM}^p_n)} is not dd-tangentially weakly defective.
  4. A generic dd-dimensional framework (G,p)(G,\bm p) has a kk-th coordinated self-stress ωk\omega^k such that rankLG,ωk=n2\operatorname{rank}L_{G,\omega^k}=n-2 for all kk.
  5. GG is 2-connected and redundantly dd-tree-connected.

The equivalence is proved in the paper for the plane, and extending the result to general dimension is explicitly identified as an open problem.

Sources & referencesView supporting material

Primary source

Tomohiro Sugiyama and Shin-ichi Tanigawa, “Generic Global Rigidity in _p-Space and the Identifiability of the p-Cayley-Menger Varieties”, arXiv:2402.18190 (2025).

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